Built-in Self-test of Programmable I/o Cells in Virtex-4 Fpgas
نویسندگان
چکیده
A Built-in Self-test (BIST) approach is presented for testing the programmable I/O cells in Field Programmable Gate Arrays (FPGAs). Using this approach, three BIST architectures and a total of 78 BIST configurations were developed to test the I/O cell logic resources and I/O buffers in all modes of operation in Xilinx Virtex-4 FPGAs. Each BIST configuration is valid for both bonded and unbonded I/O buffers such that the BIST approach is package independent. Furthermore, this general BIST approach is applicable to any FPGA or programmable System-on-a-Chip (SoC) with bidirectional I/O buffers. The experimental results, capabilities, and limitations of the BIST approach are also discussed.
منابع مشابه
Embedded Soft-Core Processor-Based Built-In Self-Test of Field Programmable Gate Arrays
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